AMP Advanced Monitoring for Production
Optimizing and Maintaining Yield through Automated Analysis Flows
Making the yield ramp as steep as possible is the goal when introducing a new product. Being able to quickly optimize the device and process for manufacturability means a faster path to profitability.
For data analysis to efficiently and effectively pinpoint and correct yield inhibitors, it requires a tool tailored for the task.
Automated analysis flows within AMP™ provide the answers needed to accelerate yield ramp and gain early profitability. The complete flow of analysis provides a common view of all relevant yield information. Automation allows focus to be on decision making and not data manipulation. The ability to trace genealogy of material through all the operations, regardless of attribute name changes such as lot name or device is crucial. This enables material matching when correlating final test or wafer sort results to WAT results.
A dynamic reporting capability allows for drilling up down or through the data as well as for sorting the underlying data and views. This provides a way for all stakeholders to communicate about the same data at levels that are relevant to each.
Another critical component of any yield system is the ability to accurately represent the actual yield at test operations. Use of both Manufacturing Execution System (MES) move yield and the datalog retest aggregation of yield at the final test operation builds confidence in the measurement.
Syntricity's AMP application is the solution for identifying problems early, maximizing yield, and remaining competitive.
AMP – Advanced Monitoring for Production Product Brief
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