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Product Characterization for Maximum Yield Ramp

Early in the semiconductor characterization life cycle, analysis of the design and process are crucial. It’s essential to isolate the root cause of yield problems that are adversely affecting the ability to manufacture a marketable device. Yield ramp losses are attributable to functional or parametric failures that stem from systematic or random defects. Finding the cause of these yield limiters means effectively executing the needed in-depth analysis and process characterization.

Collecting meaningful measurement data is the first step of the solution but these large amounts of data must be properly managed. Syntricity’s dataConductor EYM system, with its robust data warehouse capability, is optimized for the task.

Next, a powerful set of analytical tools are needed. They must feature a wide breadth of accurate statistical and charting capability but they must also be able to analyze data from across the supply chain providing visibility into the complete genealogy of the product. The Analysis Power Tools included within the dataConductor EYM system have this power.

dataConductor provides the ability to perform ad hoc analysis of any measurement across any set of independent attributes or environmental conditions of the data. This enables accelerated design closure for any type of device. Beyond that, the tools also allow the user to isolate both random and systematic yield limiters, relating both electrical and physical limitations in the manufacturing process. This means the fastest possible isolation and determination of process to design relationships that affect product yield.

Contact us and get more information about semiconductor characterization, device characterization, yield enhancement, process characterization, yield management and much more.