Optimize and maintain yield
Making the yield ramp as steep as possible is the goal when introducing a new product. Being able to quickly optimize the device and process for manufacturability means a faster path to profitability. For semiconductor test data analysis to efficiently and effectively pinpoint and correct yield inhibitors, you require a tool tailored for the task. Syntricity’s dC Production is an automated, highly interactive semiconductor yield management system that is accessed through a simple high-level dashboard.
Automated Semiconductor Test Data Analysis Flows
Automated analysis flows within dC Production provide the answers needed to accelerate yield ramp and gain early profitability. Automated test data flows collect, analyze and generate production reports that are accessed through Syntricity’s dC Production dashboard. A series of programmed “Stop Lights” and alerts displayed on the dashboard, focus attention on problem areas, while still maintaining access to all production information over a selected period of time. The ability to trace genealogy of material through all the operations, regardless of attribute name changes such as lot name or device is crucial. This enables material matching when correlating final test or wafer sort results to WAT results.
The dashboard also provides access to today’s single-lot reports and wafer map galleries, analyzed to highlight potential yield issues based on wafer spatial analysis. Users can view thousand of wafer maps in seconds or can focus only on the problematic few wafers for fast review and disposition.